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UFCS ultra-wideband shunt up to 1 GHz, 5×1.6 mm PCB footprint, for high-density SiC/GaN current measurement.

Over 70% of equipment faults show abnormal heating early. Covers thermal imaging principles, four typical heating faults, handheld/robot/drone/online practice and predictive maintenance.

Key measurement points from UNI-T product training: advanced signal-analyzer functions, high-resolution oscilloscope methods, high-bandwidth probing, channel extension and Ethernet compliance testing.

Fluxgate sensor up to 10000 A, 50 kHz bandwidth, 50 ppm accuracy, 100 mm aperture, current or voltage output.

Focus on high-end oscilloscopes, spectrum/signal analyzers and VNAs: near-field-probe EMI pre-scan, high-voltage-differential-probe power-semiconductor double-pulse testing, and automotive Ethernet compliance.

From envelope heat transfer and temperature baselines to interference removal and drone 3D thermal modeling, thermal imaging turns building heat loss into data.

LUXET Thermo100 is a fully domestic cooled mid-wave lock-in infrared microscopic imaging system for failure localization of wafers, PCBs, and various devices.

Covers infrared radiation thermometry and optical gas imaging (OGI) spectral absorption, plus four field uses: gas leak, tank level, reactor/furnace and electrical inspection.

For microwave photonics, optical communications and optoelectronic R&D: frequency range, dynamic range and phase-noise specs of the VNA4000 VNA and UTS7000A signal analyzer, plus suitable test tasks.

Passive probes cover 300 V to 80 kV, 50–500 MHz bandwidth, 10:1–2000:1 attenuation; four smart models auto-identify and compensate.

Using the PEK-510 single-phase PV inverter module, explain the islanding phenomenon and protection principle, and verify the SMS detection and protection effect via PSIM simulation.

Explains APD operating principle, the environmental and circuit challenges of dark-current measurement, and how to use an SMU for high-precision dark-current testing.

Thermo50 is an uncooled-camera-based lock-in infrared microscopy system for failure localization of packaged devices and PCBs.

In modern industrial testing, energy recovery, and power electronics, Back-to-Back Motor technology has become an important approach for efficient testing and energy-saving applications. Compared to traditional mechanical load testing methods, back-to-back motor systems enable more precise and energy-efficient testing and control through closed-loop energy flow between a motor and a generator. This technology is widely used in motor testing, inverter validation, electric vehicle (EV) powertrain evaluation, renewable energy applications, as well as in high-end manufacturing industries such as aerospace.

Measuring cell insulation resistance before electrolyte filling detects metallic foreign matter and separator damage early in production.

Facing the parallel-test challenge of silicon-photonic chips with dozens of functional units, VTECH launches four high-density PXIe SMUs (MT5238/MT5232/MT5201A/MT5252).

Contrasting point measurement, covers burden-surface monitoring, cooling-stave diagnosis and tuyere monitoring, plus optical protection, radiometric correction, AI alerts and selection criteria.

Ultra-low insertion loss, up to 20000 A RMS, accepts Ø85 mm round conductors or 150 mm busbars, typical accuracy 2%.

Build a three-phase grid-connected PV system on the PTS-5000 platform using the PEK-550 module; cover the system block diagram, wiring and digital-control learning flow.

Summarizes recent papers on Ga2O3 Schottky barrier diodes, flexible strain sensors, stretchable glucose sensors and flexible optoelectronic systems, and their use of PSS S300B SMUs and PMST systems.

Moving-coil, condenser and electret microphones convert sound to electricity in different ways. This article explains the construction, impedance, frequency response and typical applications of each type.

A systematic guide to selecting a DMM by measurement principle, bandwidth, range, digit count, and resolution based on the signal under test.

The ST5680A DC hipot tester captures built-in waveforms to distinguish sudden breakdown from gradual leakage, speeding failure analysis.

Covers spectrum analyzers, LISNs, limiters, isolation transformers for EMI pre-testing, RIGOL DSA/RSA options, and RBW requirements for quasi-peak detection.

Use the SIGLENT SVA1015X tracking generator to test an unknown attenuator, including normalization calibration and measurement steps.

Communication failures usually come from wrong menu settings, wrong cables or unconfigured PC software. This guide covers RS232, USB and LAN debugging in three steps.

The InGaAs100 Photon Emission Microscope uses an InGaAs near-infrared detector to capture device luminescence signals for defect localization in semiconductor failure analysis.

For non-contact measurement of 1400-1600°C molten iron, analyze the challenges of high-temperature measurement, dynamic flow monitoring and oxide-layer interference, and the value of IR imaging.

Compares three AI server power test load solutions — linear load, high-precision source-load, and hybrid regenerative load — and discusses key selection criteria.

Using AC voltage to detect phase imbalance and milliohm range to locate an oxidized busbar-to-breaker contact, restoring power quickly.

Introduces Hall current sensor applications and test parameters, focusing on response-time definition and measurement using a PSS HCPL100 high-current pulse source with S300 SMUs.

An insulation monitor judges the insulation condition of electrical equipment by measuring insulation resistance, usually by applying an AC test voltage and measuring the resulting current.

The LaserSight series uses laser-induced resistance change technology for metal interconnect defects and metal/semiconductor short-circuit localization.

Two methods to import CSV arbitrary waveforms into RIGOL DG series: edit the CSV header directly, or use the UltraStation PC software to create a template and download the waveform.

Covers the SNA5000A VNA's enhanced TDR: differential topology setup, de-embedding calibration, time-domain parameter selection and eye diagram analysis.

How LCR meters derive L/C/R from Z and θ, choosing series/parallel equivalent circuits, open/short correction, and signal-level modes.

A regenerative load rectifies and inverts the DUT energy back to the grid, saving power with high-quality output. This article covers its principle, difference from dissipative loads and safety protection.

For friction-overheating fire risks on mining/port/power-plant conveyors, analyze monitoring challenges and the value of online IR monitoring, hotspot localization and smart alarms.

Details two mainstream VGEth test methods (national-standard method and industry-standard method), and introduces the SiC threshold voltage drift issue with the JEP183A preconditioning solution.

From pre-test checks, power-off and discharge, wiring and voltage selection to stable readings and instrument maintenance, practical tips for automotive insulation testing.

As lithium-ion batteries scale up in EVs and ESS, fires rise with energy density and fast charging. Insulation testing should verify electrode spacing rather than just resistance.

Use the RIGOL RSA real-time spectrum analyzer's RTSA mode to measure burst transmit power of car key fobs (433.9MHz) and Bluetooth (2.4–2.485GHz).

Covers mixer fundamentals, frequency relationships, and using a VNA's scalar mixer measurement function to evaluate conversion loss, isolation and VSWR.

Electrical joints carrying current develop localized heating from poor contact, aging or overload; IR inspection provides early warning to prevent failures and fires.

Reviews Kewell's fuel cell test technology evolution since 2017, covering regenerative electronic loads, DC/DC test systems, and engine/stacks test systems.

Kewell's MX300D IGBT dynamic test system is designed for power semiconductor manufacturers, quality inspection labs, and university labs, supporting single-pulse, double-pulse, turn-on/off, and short-circuit tests.

Why insulation testing matters, the principle, why a multimeter cannot do it, and safe measurement steps with a digital high-voltage insulation tester (UT513B/513C).

Home lighting evaluation has evolved from lux/CCT alone to a three-in-one assessment of eye-care, flicker and circadian rhythm. The SFIM series integrates illuminance/spectrum, flicker and melanopic metrics in one instrument.

Explains key current-probe specs — frequency response (bandwidth), rise time, insertion loss and transfer impedance — and how insufficient bandwidth distorts CW and pulse measurements.

Non-contact IR thermography to find bearing damage, stator-rotor rub, loose wiring and poor cooling in motors by detecting abnormal internal and casing heating.

EFT/B is a train of very fast, high-repetition high-voltage spikes that cause resets, freezes and communication errors. This article explains IEC 61000-4-4 / GB/T 17626.4 requirements and instrument selection.

Choose the surge method by cable type: unbalanced lines use an asymmetrical CDN for line-line/line-ground tests, balanced lines use a symmetrical CDN for line-ground tests, with notes on coupling-device waveform effects and calibration.

Non-contact preventive maintenance of distribution cabinets: auto hot/cold-spot finding, voltage-system scanning, and connection/component checks to reveal miswiring and overheating.

A case study on non-linear impact loads (robot track motors, high-power fans): continuous three-phase harmonic and THD monitoring with the UT285C analyzer to locate the root cause of frequent failures.

Using spectroscopic measurement and SBCT stray-light correction, the SPIC-500BW one-key measures spectrum, illuminance, chromaticity, CCT, CRI, color tolerance, TLCI and melanopic illuminance.

Addressing large variations in harness impedance and parasitic capacitance across models and difficult large-current control, the PNS 80C200 accurately reproduces vehicle grid R/C characteristics for 48V compliance testing.

To meet the demands of multi-port microwave device testing, the Ceyear 3657 cascade option links two 4-port VNAs into an 8-port system covering 9 kHz to 26.5 GHz.

Using the CIQTEK tungsten-filament SEM3200 to observe the microstructure of polyester, polypropylene and electrospun nanofibers, guiding process optimization of functional fabrics.

The 6956 PXIe VNA gives each port an independent reference and measurement receiver, achieving full-channel simultaneous measurement over the PXIe bus for R&D and production.

Using the CIQTEK benchtop EPR200M with a novel 3D-printed flat electrolytic cell to capture amino and phenolic radical intermediates in situ with time resolution for mechanistic evidence.

CEYEAR upgraded its VNA noise-figure analysis option from 50 GHz to 67 GHz, breaking the high-frequency cold-source measurement bottleneck.

Auto-ranging wide-range output, CV/CC/CP mode transition, communication interfaces and options, plus master-slave paralleling up to 1.5 MW.

Using 4/5/6 Series MSOs and PWR software: probe deskew, power quality, harmonics, inrush, switching loss, RDS(on), SOA and magnetic analysis.

Explains back-EMF generation, its hazard to servo controllers and bleed-absorption protection, plus a 28 V/270 V dual-platform GJB181B-2012 power-characteristics test solution.

DPT theory, three-stage waveforms, turn-on/turn-off and reverse-recovery definitions, and a practical setup using the AFG31000 and 4/5/6 Series MSO.

The HY-HP 20-1500 (20 V/1500 A) high-power programmable DC supply is used in BMW Brilliance's automotive electronics test system, covering low-voltage component withstand-voltage and NEV high-voltage ripple tests.

IsoVu isolated current probes provide full RF isolation between tip and scope, eliminating ground loops with up to 90 dB CMRR at 1 MHz for low-noise shunt measurements.